SEMICONDUCTOR MEMORY DEVICE, METHOD FOR REPAIRING

专利名称：SEMICONDUCTOR MEMORY DEVICE,

METHOD FOR REPAIRING BAD COLUMNAND SETTING METHOD FOR SETTINGREDUNDANT INFORMATION THEREOF

发明人：YANO, Masaru申请号：EP16178002.8申请日：20160705公开号：EP3115995A1公开日：20170111

专利附图：

摘要：A method for repairing of the invention includes steps as follows: storing

redundant information including an address of the bad column, identification informationfor identifying a failure in which one of an even column or an odd column of the badcolumn and an address of a redundant column of a redundant memory region forrepairing the bad column; determining whether a column address of a selected column isconsistent with the address of the bad column based on the redundant information; whenconsistent, converting a column of the bad column having the failure into a column of theredundant column based on the identification information; and not converting anothercolumn of the bad column without the failure into another column of the redundantcolumn.

申请人：Winbond Electronics Corp.

地址：No. 8 Keya 1st Rd., Daya District, Central Taiwan Science Park, Taichung City,Taiwan. TW

国籍：TW

代理机构：Chamberlain, Alan James

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